|Solar Cell CIGS Minority Carrier Life Time Measurement by Time Correlated Single Photon Counting|
|Presenter||Walter Y Mok|
|Full Author List||Tian Kai, Jeff Corbett, Yung Chung, Robert Weiss|
Here we present a novel technique to predict a CIGS thin film solar cell efficiency by measuring the minority carrier life time by time correlated single photon counting technique instead of measuring it with a completed solar cell. This cost saving technique also provides a method to monitor the CIGS thin film coating process to maximize the solar cell effiency.