| Solar Cell CIGS Minority Carrier Life Time Measurement by Time Correlated Single Photon Counting | |
| Abstract ID | 100 |
| Presenter | Walter Y Mok |
| Presentation Type | Poster |
| Full Author List | Tian Kai, Jeff Corbett, Yung Chung, Robert Weiss |
| Affiliations |
SLAC |
| Category | |
| Abstract |
Here we present a novel technique to predict a CIGS thin film solar cell efficiency by measuring the minority carrier life time by time correlated single photon counting technique instead of measuring it with a completed solar cell. This cost saving technique also provides a method to monitor the CIGS thin film coating process to maximize the solar cell effiency. |
| Footnotes |
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| Funding Acknowledgement | |