Abstract Details 100

Solar Cell CIGS Minority Carrier Life Time Measurement by Time Correlated Single Photon Counting
Abstract ID 100
Presenter Walter Y Mok
Presentation Type Poster
Full Author List Tian Kai, Jeff Corbett, Yung Chung, Robert Weiss



Here we present a novel technique to predict a CIGS thin film solar cell efficiency by measuring the minority carrier life time by time correlated single photon counting technique instead of measuring it with a completed solar cell. This cost saving technique also provides a method to monitor the CIGS thin film coating process to maximize the solar cell effiency.



Funding Acknowledgement