Abstract Details 166

A New Capability at SSRL: Resonant Soft X-ray Scattering
Abstract ID 166
Presenter Hoyoung Jang
Presentation Type Poster
Full Author List Glen Kerr, Abraham Maciel, Alex Garachtchenko, Tracy Yott1, Mike Horton, Mike Nalls, Bart Johnson, Donghui Lu, Chi-Chang Kao, Pe



SSRL recently developed a resonant soft x-ray scattering (RSXS) capability which is very powerful for exploring material sciences – emergent quantum materials (oxides) and energy materials (organics, energy storage). Because the RSXS technique probes structural, and chemical specific information via a spatial periodicity of charge, orbital, spin, and lattice. Furthermore, the soft x-ray range is particularly relevant for a study of soft materials as it covers the K-edge of C, N, F, and O, and the L-edges of transition metals. This RSXS end-station composed of in-vacuum 4-circle diffractometer. Liquid helium cryostat enables research of low temperature (T~ 25K) ordered materials. Since elliptically polarized undulator (EPU) of BL 13-3 offers more degree of freedoms for controlling x-ray polarizations (linear and circular), RSXS can also investigate a morphology effect of local domain/grain in materials. The detailed introduction of the RSXS end-station with further upgrade plans and several preliminary results will be touched.



Funding Acknowledgement